• NUCLEAR TECHNIQUES
  • Vol. 46, Issue 2, 020203 (2023)
Cuicui LIU1, Zhiming LI2, Jinhua HAN1, Gang GUO1、*, Qian YIN1, Yanwen ZHANG1, and Jiancheng LIU1
Author Affiliations
  • 1National Radiation Application Center, China Institute of Atomic Energy, Beijing 102413, China
  • 2School of Nuclear Science and Technology, Lanzhou University, Lanzhou 730000, China
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    DOI: 10.11889/j.0253-3219.2023.hjs.46.020203 Cite this Article
    Cuicui LIU, Zhiming LI, Jinhua HAN, Gang GUO, Qian YIN, Yanwen ZHANG, Jiancheng LIU. Proton irradiation damage in silicon carbide junction barrier Schottky diode[J]. NUCLEAR TECHNIQUES, 2023, 46(2): 020203 Copy Citation Text show less
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    Cuicui LIU, Zhiming LI, Jinhua HAN, Gang GUO, Qian YIN, Yanwen ZHANG, Jiancheng LIU. Proton irradiation damage in silicon carbide junction barrier Schottky diode[J]. NUCLEAR TECHNIQUES, 2023, 46(2): 020203
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