[2] HARTLER G,GOLZE U,PASCHKE K.Extended noise analysis-a novel tool for reliability screening[J].Microelectronics Reliability,1998,38(6-8):1193-1198.

[4] SHI Jia-wei,JIN En-shun,MA Jing,et al.An improved approach and experimental results of a low-frequency noise measurement technique used for reliability estimation of diode lasers[J].Microelectronics Reliability,1994,34(7):1261-1264.

[5] DAI Yi-song.A study of optical noise measurement as reliabity estimation of diodes[J].Microelectronics Reliability,1995,35(4):731-734.

[6] HU Gui-jun,SHI Jia-wei,ZHANG Su-mei,et al.Correlation between the low-frequencyelectrical noise of high-power quantum well lasers and device quanlity[C].SPIE,2000,4220:217-220.

[12] MALLAT S.A theory for multiresolution signal decomposition:the wavelet representation[J].IEEE Pattern Analysis and Machine Intell,1989,11(7):674-693.