Researching | Vertical Measurement Method for Structured Light Three-Dimensional Profilometry Based on Phase-Shifting and Modulation Ratio

Journals >Chinese Journal of Lasers >Volume 46 >Issue 7 >Page 0704003 > Article

Chinese Journal of Lasers
Vol. 46, Issue 7, 0704003 (2019)

Vertical Measurement Method for Structured Light Three-Dimensional Profilometry Based on Phase-Shifting and Modulation Ratio

Mingteng Lu¹ and Xianyu Su^2、*

Author Affiliations

¹ Southwest Institute of Technical Physics, Chengdu, Sichuan 610041, China

² School of Electronics and Information Engineering, Sichuan University, Chengdu, Sichuan 610065, China

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DOI: 10.3788/CJL201946.0704003 Cite this Article Set citation alerts

Mingteng Lu, Xianyu Su. Vertical Measurement Method for Structured Light Three-Dimensional Profilometry Based on Phase-Shifting and Modulation Ratio[J]. Chinese Journal of Lasers, 2019, 46(7): 0704003 Copy Citation Text

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References

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Mingteng Lu, Xianyu Su. Vertical Measurement Method for Structured Light Three-Dimensional Profilometry Based on Phase-Shifting and Modulation Ratio[J]. Chinese Journal of Lasers, 2019, 46(7): 0704003

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