Optical characterization of antimony-based bismuth-doped thin films with different annealing temperatures

Xinmiao Lu; Yiqun Wu; Yang Wang; Jinsong Wei

doi:10.3788/col201109.102101

Journals >Chinese Optics Letters >Volume 9 >Issue 10 >Page 102101 > Article

Chinese Optics Letters
Vol. 9, Issue 10, 102101 (2011)

Optical characterization of antimony-based bismuth-doped thin films with different annealing temperatures

Xinmiao Lu¹, Yiqun Wu^1、2, Yang Wang¹, and Jinsong Wei¹

Author Affiliations

¹Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

²Key Lab of Functional Inorganic Material Chemistry, Ministry of Education, Heilongjiang University, Harbin 150080, China

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DOI: 10.3788/col201109.102101 Cite this Article Set citation alerts

Xinmiao Lu, Yiqun Wu, Yang Wang, Jinsong Wei. Optical characterization of antimony-based bismuth-doped thin films with different annealing temperatures[J]. Chinese Optics Letters, 2011, 9(10): 102101 Copy Citation Text

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Xinmiao Lu, Yiqun Wu, Yang Wang, Jinsong Wei. Optical characterization of antimony-based bismuth-doped thin films with different annealing temperatures[J]. Chinese Optics Letters, 2011, 9(10): 102101

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