• Electronics Optics & Control
  • Vol. 29, Issue 4, 106 (2022)
LI Wen, LI Xiaochun, and YAN Haolei
Author Affiliations
  • [in Chinese]
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    DOI: 10.3969/j.issn.1671-637x.2022.04.020 Cite this Article
    LI Wen, LI Xiaochun, YAN Haolei. PCB Defect Detection Based on Improved YOLO v3[J]. Electronics Optics & Control, 2022, 29(4): 106 Copy Citation Text show less
    References

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    LI Wen, LI Xiaochun, YAN Haolei. PCB Defect Detection Based on Improved YOLO v3[J]. Electronics Optics & Control, 2022, 29(4): 106
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