• Chinese Journal of Lasers
  • Vol. 38, Issue 1, 102002 (2011)
Cui Jinjiang1、*, Ning Yongqiang2, Jiang Chenyu1, Wang Fan1, Gao Jing1, Zhang Xing2, Wang Zhenfu2, Wu Xiaodong1, and Tan Huiming1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/cjl201138.0102002 Cite this Article Set citation alerts
    Cui Jinjiang, Ning Yongqiang, Jiang Chenyu, Wang Fan, Gao Jing, Zhang Xing, Wang Zhenfu, Wu Xiaodong, Tan Huiming. Beam Quality of High Power Vertical-Cavity Bottom-Emitting Semiconductor Lasers[J]. Chinese Journal of Lasers, 2011, 38(1): 102002 Copy Citation Text show less

    Abstract

    Research on the beam quality of high-power bottom-emitting laser-diode from the M2 factor, the far field divergence angle, near field and far-field intensity distribution is done. Analysis of different device parameters on the beam quality is also made. Vertical cavity surface emitting laser (VCSEL) array with a novel arrangement is designed. By the modulation of the aperture size and the centre spacing of the units, high power density up to 1 kW/cm2 and good beam property of Gaussian far-field distribution at 4 A injecting current are obtained. Compared with the single device and the 4×4 two-dimensional array with the same total lasing area, the novel array is better in the property of lasing spectra and far-field distribution, etc.
    Cui Jinjiang, Ning Yongqiang, Jiang Chenyu, Wang Fan, Gao Jing, Zhang Xing, Wang Zhenfu, Wu Xiaodong, Tan Huiming. Beam Quality of High Power Vertical-Cavity Bottom-Emitting Semiconductor Lasers[J]. Chinese Journal of Lasers, 2011, 38(1): 102002
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