[1] F. G. Bachmanm, Proc. SPIE 5336, 95 (2004).
[2] F. Bachmann, Appl. Surface Sci. 208, 125 (2003).
[3] B. Chann, R. K. Huang, L. J. Missaffia, C. T. Harris, Z. L. Liau, A. K. Goyal, J. P. Donnelly, T. Y. Fan, A. Sanchez-Rubio, and G. W. Turner, Opt. Lett. 30, 2104 (2005).
[4] B. Chann, I. Nelson, and T. G. Walker, Opt. Lett. 25, 1352 (2000).
[5] Y. Zheng and H. Kan, Opt. Lett. 30, 2424 (2005).
[6] V. V. Apollonov, S. I. Derzhavin, V. A. Filonenko, V. V. Kuzminov, D. A. Mashkovsky, and A. M. Prokhorov, Proc. SPIE 3889, 134 (2000).
[7] K. Wang, Q. Li, W. Guo, P. Zhao, and T. Zuo, High Power Laser and Particle Beams (in Chinese) 18, 177 (2006).
[8] F. X. D'Amato, E. T. Siebert, and C. Roychoudhuri, Appl. Phys. Lett. 55, 816 (1989).
[9] J. R. Leger, Appl. Phys. Lett. 55, 334 (1989).
