Ultra-low detection delay drift caused by the temperature variation in a Si-avalanche-photodiode-based single-photon detector

Yurong Wang; Linli Wang; Chenyi Wu; Zhaohui Li; Lei Yang; Guang Wu

doi:10.3788/COL202119.082502

Journals >Chinese Optics Letters >Volume 19 >Issue 8 >Page 082502 > Article

Chinese Optics Letters
Vol. 19, Issue 8, 082502 (2021)

Ultra-low detection delay drift caused by the temperature variation in a Si-avalanche-photodiode-based single-photon detector

Yurong Wang, Linli Wang, Chenyi Wu, Zhaohui Li^*, Lei Yang, and Guang Wu^**

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State Key Laboratory of Precision Spectroscopy, East China Normal University, Shanghai 200241, China

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DOI: 10.3788/COL202119.082502 Cite this Article Set citation alerts

Yurong Wang, Linli Wang, Chenyi Wu, Zhaohui Li, Lei Yang, Guang Wu. Ultra-low detection delay drift caused by the temperature variation in a Si-avalanche-photodiode-based single-photon detector[J]. Chinese Optics Letters, 2021, 19(8): 082502 Copy Citation Text

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