• Optoelectronics Letters
  • Vol. 15, Issue 2, 98 (2019)
Ya-chao ZHANG1、2、*, Peng LIU1、2, Xiao-guang WANG1, Ling-ping HE1, and Bo CHEN1
Author Affiliations
  • 1Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China
  • 2University of Chinese Academy of Sciences, Beijing 100059, China
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    DOI: 10.1007/s11801-019-8124-3 Cite this Article
    ZHANG Ya-chao, LIU Peng, WANG Xiao-guang, HE Ling-ping, CHEN Bo. A novel method to characterize the angular resolutionof soft X-ray grazing incidence telescope[J]. Optoelectronics Letters, 2019, 15(2): 98 Copy Citation Text show less

    Abstract

    In this paper, a novel method is proposed to characterize the operation-waveband angular resolution of the soft X-ray grazing incidence telescope. According to the method, the first is to restore the “geometric image” by removing the aperture diffraction effect from the resolution testing target image measured at visible waveband. The second is to calculate the operation-waveband resolution testing target image by the convolution of “geometric image”, diffraction point spread function and surface scattering point spread function. Finally, the operation-waveband (4.47 nm) angular resolution of 9.72" is calculated according to the operation-waveband resolution testing target image on axis. The method does not need to be performed in vacuum and to place the source away from the solar X-ray grazing incidence telescope, which greatly reduces the testing cost and improves the efficiency for the development of the soft X-ray grazing incidence telescope.
    ZHANG Ya-chao, LIU Peng, WANG Xiao-guang, HE Ling-ping, CHEN Bo. A novel method to characterize the angular resolutionof soft X-ray grazing incidence telescope[J]. Optoelectronics Letters, 2019, 15(2): 98
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