• Optics and Precision Engineering
  • Vol. 29, Issue 10, 2421 (2021)
Lie BI, Juan ZHANG*, Yi YANG, Wen-rong WU, and Xi DAI
Author Affiliations
  • Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang621900, China
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    DOI: 10.37188/OPE.20212910.2421 Cite this Article
    Lie BI, Juan ZHANG, Yi YANG, Wen-rong WU, Xi DAI. Interference fit control for weak micro-parts based on deformation detection[J]. Optics and Precision Engineering, 2021, 29(10): 2421 Copy Citation Text show less
    Structure of silicon arm, aluminum sleeve and TMP component
    Fig. 1. Structure of silicon arm, aluminum sleeve and TMP component
    Relationship between gray-scale and deformation
    Fig. 2. Relationship between gray-scale and deformation
    Gray-scale calculation diagram of claw
    Fig. 3. Gray-scale calculation diagram of claw
    Relationship analysis between deformation and pose
    Fig. 4. Relationship analysis between deformation and pose
    Relationship curves of α-h
    Fig. 5. Relationship curves of α-h
    Relationship model between deformation and pose
    Fig. 6. Relationship model between deformation and pose
    Attitude model in 3D space
    Fig. 7. Attitude model in 3D space
    Analysis of contact point in claw direction
    Fig. 8. Analysis of contact point in claw direction
    Analysis of contact point on the claw bisector
    Fig. 9. Analysis of contact point on the claw bisector
    Analysis of contact point between two claws
    Fig. 10. Analysis of contact point between two claws
    Schematic diagram of silicon arm and sleeve with only position deviation
    Fig. 11. Schematic diagram of silicon arm and sleeve with only position deviation
    Deformation and gray-scale variation trend
    Fig. 12. Deformation and gray-scale variation trend
    Deformation analysis of silicon arm
    Fig. 13. Deformation analysis of silicon arm
    Interference fit control strategy
    Fig. 14. Interference fit control strategy
    Burrs affect gray-scale variations
    Fig. 15. Burrs affect gray-scale variations
    Assembly experiment based on deformation control
    Fig. 16. Assembly experiment based on deformation control
    Approach trajectory and TMP photograph
    Fig. 17. Approach trajectory and TMP photograph
    等级12345
    灰度
    权重q1q2q3q4q5
    Table 1. Gray-scale grade distribution
    Lie BI, Juan ZHANG, Yi YANG, Wen-rong WU, Xi DAI. Interference fit control for weak micro-parts based on deformation detection[J]. Optics and Precision Engineering, 2021, 29(10): 2421
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