• Optics and Precision Engineering
  • Vol. 17, Issue 3, 519 (2009)
QIAO Yu-jing* and L Ning
Author Affiliations
  • [in Chinese]
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    DOI: Cite this Article
    QIAO Yu-jing, L Ning. Precision estimation of aspheric surface by stitching interferometry based on correcting aberration[J]. Optics and Precision Engineering, 2009, 17(3): 519 Copy Citation Text show less
    References

    [1] KIM C J,WYANT J. Subaperture test of a large flat on a fast spherical surface[J]. Opt. Soc. Am.,1981,71,15-87.

    [2] WANG X K, ZHANG X J, WANG L H, et al.. Mathematical model and simulation for testing aspheric surface by annular subaperture stitching interferomety[J]. Opt. Precision Eng., 2006,14(4):527-533.(in Chinese)

    [3] HOU X, WU F, YANG L, et al.. Layout model and analysisi of annular subaperture stitching technique for testing large aspheric mirror [J]. Opt. Precision Eng., 2006,14(2):207-212.(in Chinese)

    [4] WANG X K, WANG L H, ZHANG X J. Testing asphere by subaperture stitching interferometric method [J]. Opt. Precision Eng., 2006,15(2):192-197. (in Chinese)

    [5] MURPHY P. Stitching interferometry: a flexible solution for surface metrology [J]. Optics and Photonics News, 2003,5(14):38-43.

    [6] CHENG W M, LIN Y L, CHEN M Y. Factors having influence on the accuracy of multi-aperture overlape-scanning technique (MAOST) and analysis[J]. Acta Iptica Sincica,1993,13(8): 711-716.(in Chinese)

    [7] ZHANG M Y, LI X N. Accuracy analysis of stitching interferometry for test of large diameter mirror[J]. Journal of Applied Optics, 2006,27(5):447-449. (in Chinese)

    [8] ZHANG R ZH, Y CH L, SHI Q K, et al.. Principle and Accuracy of the Stitching Interferometer[J]. Acta Optica Sincica,2003,23(10): 1241-1244. (in Chinese)

    [9] WANG S G, CHEN M, CHEN P. Linear Statistical Models:Linear Regression and Analysis of Variance[M]. Beijing: Higher Education Press,2004. (in Chinese)

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    QIAO Yu-jing, L Ning. Precision estimation of aspheric surface by stitching interferometry based on correcting aberration[J]. Optics and Precision Engineering, 2009, 17(3): 519
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