• Study On Optical Communications
  • Vol. 46, Issue 2, 50 (2020)
ZHANG Shu-e and YU Xing-yuan*
Author Affiliations
  • [in Chinese]
  • show less
    DOI: 10.13756/j.gtxyj.2020.02.011 Cite this Article
    ZHANG Shu-e, YU Xing-yuan. A Method for Measuring the Thickness of Dielectric Thin Films on the Inner Wall of a Cylindrical Cavity[J]. Study On Optical Communications, 2020, 46(2): 50 Copy Citation Text show less
    References

    [6] Dupont J, Mignot G, Zboray R,et al.Infrared Film Thickness Measurement:Comparison with Cold Neutron Imaging[J]. Journal of Nuclear Science and Technology, 2016, 53(5): 673-681.

    [7] Lubnow M, Jeffries J B, Dreier T,et al.Water Film Thickness Imaging based on Time-multiplexed Near-infrared Absorption[J].Optics Express,2018,26(16):20902-20912

    [11] Ju P, Yang X H, Schlegel J P, et al. Average Liquid Film Thickness of Annular Air-water Two-phase Flow in 8×8 Rod Bundle[J].International Journal of Heat and Fluid Flow,2018(73):63-73.

    ZHANG Shu-e, YU Xing-yuan. A Method for Measuring the Thickness of Dielectric Thin Films on the Inner Wall of a Cylindrical Cavity[J]. Study On Optical Communications, 2020, 46(2): 50
    Download Citation