[2] WELCH D F. A brief history of high-power semiconductor lasers[J]. Selected Topics in Quantum Electronics IEEE Journal of, 2000, 6(6): 1470-1477.
[3] LI Ming-liang, WANG Zu-chao, WANG Guang-xiang, et al. Research on improving the reliability of semiconductor laser[J]. Science Technology and Engineering, 2006, 6(16): 2545-2547.
[4] LIU Bin, LIU Yuan-yuan, CUI Bi-feng. Long-term aging and failure analysis for 980nm laser diodes[J]. Laser & Optoelectronics Progress, 2012, 49(09): 123-127.
[5] BOGOMOL′NYI V M. Theory of nondestructive testing in the electrical degradation of semiconductor devices[J]. Measurement Techniques, 2001, 44(5): 513-517.
[6] JONES B K. Electrical noise as a reliability indicator in electronic devices and components[J]. IEE Proceedings-Circuits, Devices and Systems, 2002, 149(1): 13-22.
[8] HOOGE F N. The relation between 1/f noise and number of electrons[J]. Physica B Condensed Matter, 1990, 162(3): 344-352.
[10] ZHANG Shuang, GUO Shu-xu, GAO Feng-li, et al. Investigation on 1/f noise peak and its mechanism of laser diodes[J]. Journal of Optoelectronics·Laser, 2008, 19(9): 1170-1172.
[11] CHEN X Y, PEDERSEN A, HELLES O G, et al. Electrical noise of laser diodes measured over a wide range of bias currents[J]. Microelectronics Reliability, 2000, 40(11): 1925-1928.
[12] PARK S J, JEON D Y, AHN S E, et al. Static electrical characterization and low frequency noise of a-InHfZnO thin film transistors[J]. Thin Solid Films, 2013, 548(12): 560-565.
[13] GAO Feng-li, GUO Shu-xu, CAO Jun-sheng, et al. The characteristic of low-frequency electrical noise in high-power semiconductor laser diodes at low bias currents[J]. Journal of Optoelectronics·Laser, 2008, 19(4):449-452.
[14] HOOGE F N. 1/f noise sources[J]. IEEE Transactions on Electron Devices, 2004, 41(11):1926-1935.
[15] KLEINPENNING T G M. 1/f noise in p-n junction diodes[J]. Journal of Vacuum Science & Technology A Vacuum Surfaces & Films, 1985, 3(1): 176-182.
[16] CHEN X Y, PEDERSEN A, RHEENEN A D V. Effect of electrical and thermal stress on low-frequency noise characteristics of laser diodes[J]. Microelectronics Reliability, 2001, 41(1): 105-110.
[17] WORNELL G, OOOENHEIM A V. Signal processing with fractals: a wavelet-based approach[J]. Journal of the Acoustical Society of America, 1999, 105(1): 18-18.
[18] WU C M, YANG E S. Current suppression induced by conduction-band discontinuity in Al0.35Ga0.65As-GaAs N-p heterojunction diodes[J]. Journal of Applied Physics, 1980, 51(4): 2261-2263.