[1] Da SILVA L B, BARBEE Jr T W, CAUBLE R, et al. Electron density measurements of high density plasma using soft X-ray laser interferometry[J]. Phys Rev Lett, 1995, 74(20): 3991-3994.
[2] WAN A S, BARBEE Jr T W, CAUBLE R, et al. Electron density measurement of a colliding plasma using soft-X-ray laser interferometry[J]. Physical Review Letters E , 1997, 55(5): 6293-6296.
[4] WANG Chen, WANG Wei, SUN Jin-ren, et al. Experimental diagnoses of plasma electron density by interferometry using an X-ray-laser as probe[J]. Acta Physica Sinica, 2005, 54(1): 202-205.
[5] STONER J O. Collodion-reinforcement and plasma-cleaning of target foils[J]. Nuclear Instruments and Methods in Physics Research A, 2002, 480(1): 171-177.
[6] YOSHIKAWA L I, MURACHI T. New multilayer coating for 30. 4 nm radiation[C]. SPIE, 2004, 5533: 163-170.
[7] GAO Feng-ju, ZHENG Rui-ting, CHENG Guo-an. Research progress in preparation of self-supporting thin film[J]. Materials Review, 2007, 21(6): 1-8.
[8] DU Ying-hui, XU Guo-ji, WANG Rui-lan, et al. Preparation of X-ray filter foils[J]. Atomic Energy Science and Technology, 2005, 39(6): 552-554.
[9] WU Gui-fang, SHI Shou-hua, HE Yu-ping, et al. Influence of annealing temperature on microstructures and stress of sputtered Cu film on Si substrate[J]. Journal of Vacuum Science and Technology, 2002, 22(2): 139-142.