[1] W. B. Seales and S. Dutta, Proc. SPIE 2905, 227 (1996).
[2] G. Pajares and J. M. Cruz, Pattern Recogn. 37, 1855 (2004).
[3] Z. Zhang and R. S. Blum, Proc. IEEE 87, 1315 (1999).
[4] G. Liu, Z. Jing, S. Sun, J. Li, Z. Li, and H. Leung, Chin. Opt. Lett. 2, 386 (2004).
[5] G. Piella, Inform. Fusion 4, 259 (2003).
[6] Z. Li, Z. Jing, and S. Sun, Chin. Opt. Lett. 2, 82 (2004).
[7] S. Li, J. Kwok, and Y. Wang, Inform. Fusion 2, 169 (2001).
[8] S. Mukhopadhyay and B. Chanda, Pattern Recogn. 34, 1939 (2001).
[9] I. De and B. Chand, Signal Process. 86, 924 (2006).
