• Opto-Electronic Engineering
  • Vol. 34, Issue 4, 81 (2007)
[in Chinese]
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  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese]. Investigation of white-light speckle interferometry with radial scanning aperture[J]. Opto-Electronic Engineering, 2007, 34(4): 81 Copy Citation Text show less

    Abstract

    [in Chinese]. Investigation of white-light speckle interferometry with radial scanning aperture[J]. Opto-Electronic Engineering, 2007, 34(4): 81
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