• Optics and Precision Engineering
  • Vol. 10, Issue 6, 592 (2002)
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  • 1[in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Analysis of the transmission efficiency of a two-channel elliptical crystal spectrometer[J]. Optics and Precision Engineering, 2002, 10(6): 592 Copy Citation Text show less
    References

    [3] Henke B L, Gulliksen E M,Davis J C. X-ray interaction: photoabsorption, scattering, transmission and reflection at E=50-30000eV, Z=1-92[J]. Atomic Data and Nuclear Data Tables, 1993,54(2):181-200.

    [4] Okamoto Y, Yoshikawa M, Yamaguchi N, et al. Absolute calibration of space and time-resolving flat-field vacuum ultraviolet spectrograph under both P and S polarized light conditions for plasma diagnostics [J]. Rev.Sci.Instrum. 2001,72(12): 4366-4371.

    [7] Henke B L, Yamada H T,Tanaka T J. Pulsed plasma source spectrometry in the 80-8000eV X-ray region[J].Rev.Sci.Instrum, 1983,54(10):1311-1316.

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Analysis of the transmission efficiency of a two-channel elliptical crystal spectrometer[J]. Optics and Precision Engineering, 2002, 10(6): 592
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