Fabrication and measurement of optical characterization of one dimensional photonic crystal with defect

Kai Tong; Fei Wu; Zhibin Wang

doi:10.3788/COL20100801.0099

Journals >Chinese Optics Letters >Volume 8 >Issue 1 >Page 99 > Article

Chinese Optics Letters
Vol. 8, Issue 1, 99 (2010)

Fabrication and measurement of optical characterization of one dimensional photonic crystal with defect

Kai Tong, Fei Wu, and Zhibin Wang

Author Affiliations

College of Electrical Engineering, Yanshan University, Qinhuangdao 066004, China

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DOI: 10.3788/COL20100801.0099 Cite this Article Set citation alerts

Kai Tong, Fei Wu, Zhibin Wang. Fabrication and measurement of optical characterization of one dimensional photonic crystal with defect[J]. Chinese Optics Letters, 2010, 8(1): 99 Copy Citation Text

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Kai Tong, Fei Wu, Zhibin Wang. Fabrication and measurement of optical characterization of one dimensional photonic crystal with defect[J]. Chinese Optics Letters, 2010, 8(1): 99

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