• Opto-Electronic Engineering
  • Vol. 38, Issue 12, 52 (2011)
WEI Xiao-hong*, GAO Bo, LI Qiang, XU Kai-yuan, LIU Ang, and CHAI Li-qun
Author Affiliations
  • [in Chinese]
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    DOI: 10.3969/j.issn.1003-501x.2011.12.010 Cite this Article
    WEI Xiao-hong, GAO Bo, LI Qiang, XU Kai-yuan, LIU Ang, CHAI Li-qun. Digital Measurement of the Stress of KDP Crystal[J]. Opto-Electronic Engineering, 2011, 38(12): 52 Copy Citation Text show less

    Abstract

    Using the high precision digital stress measurement instrument, we measured the stress of KDP crystal. Through measuring the optical axis of KDP, the birefringence of ordinary light and extraordinary light is diminished, and the inner stress of the KDP is gained, The repeatability of measurement is better than 0.1 nm/cm. The high precision digital stress measurement of KDP is of great importance to machining and utilization.
    WEI Xiao-hong, GAO Bo, LI Qiang, XU Kai-yuan, LIU Ang, CHAI Li-qun. Digital Measurement of the Stress of KDP Crystal[J]. Opto-Electronic Engineering, 2011, 38(12): 52
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