• Acta Photonica Sinica
  • Vol. 49, Issue 4, 0410006 (2020)
Jia-cheng HU1, Di-xin YAN1, Yu-shu SHI2, Lu HUANG2, and Dong-sheng LI1
Author Affiliations
  • 1College of Metrology&Measurement Engineering, University of China Jiliang, Hangzhou 310018, China
  • 2Division of Nano Metrology and Materials Measurement, National Institute of Metrology, Beijing 100029, China
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    DOI: 10.3788/gzxb20204904.0410006 Cite this Article
    Jia-cheng HU, Di-xin YAN, Yu-shu SHI, Lu HUANG, Dong-sheng LI. Restoration Method of Atomic Force Microscopy Image Based on Transfer Learning[J]. Acta Photonica Sinica, 2020, 49(4): 0410006 Copy Citation Text show less
    AFM tip scanning sample surface diagram
    Fig. 1. AFM tip scanning sample surface diagram
    Chief flowchart
    Fig. 2. Chief flowchart
    Structure diagram of U-Net network
    Fig. 3. Structure diagram of U-Net network
    Sketch map of model
    Fig. 4. Sketch map of model
    Reconstruction errors of grating images
    Fig. 5. Reconstruction errors of grating images
    Training results of source model
    Fig. 6. Training results of source model
    Diagram of step structure
    Fig. 7. Diagram of step structure
    Training results of target model
    Fig. 8. Training results of target model
    Jia-cheng HU, Di-xin YAN, Yu-shu SHI, Lu HUANG, Dong-sheng LI. Restoration Method of Atomic Force Microscopy Image Based on Transfer Learning[J]. Acta Photonica Sinica, 2020, 49(4): 0410006
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