Effect of grain size on ferroelectric and dielectric properties of Bi3.25La0.75Ti3O12 thin films prepared by rf-magnetron sputtering

{Bi}_{3.25}

{La}_{0.75}

{Ti}_{3}

O_{12}

Shuai Ma^1,2,*, Wei Li³, Jigong Hao³, Yuying Chen¹, and Zhijun Xu⁴

Author Affiliations

¹School of Medicine, Liaocheng University, Liaocheng 252059, P. R. China

²Beijing Key Laboratory of Digital Stomatology, Beijing 100081, P. R. China

³School of Materials Science and Engineering, Liaocheng University, Liaocheng 252059, P. R. China

⁴School of Environment and Materials Engineering, Yantai University, Yantai 264005, P. R. China

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DOI: 10.1142/S2010135X23500170 Cite this Article

Shuai Ma, Wei Li, Jigong Hao, Yuying Chen, Zhijun Xu. Effect of grain size on ferroelectric and dielectric properties of

{Bi}_{3.25}

{La}_{0.75}

{Ti}_{3}

O_{12}

thin films prepared by rf-magnetron sputtering[J]. Journal of Advanced Dielectrics, 2023, 13(5): 2350017 Copy Citation Text

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References

Shuai Ma, Wei Li, Jigong Hao, Yuying Chen, Zhijun Xu. Effect of grain size on ferroelectric and dielectric properties of

{Bi}_{3.25}

{La}_{0.75}

{Ti}_{3}

O_{12}

thin films prepared by rf-magnetron sputtering[J]. Journal of Advanced Dielectrics, 2023, 13(5): 2350017

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