[1] Xin CHEN, Chun-hua CHEN, You-xiang WANG. Study of secondary ion emission from GaAs under O2+ and Cs+ ion bombardment. Chinese Journal of Semiconductors, 16, 125-132(1995).
[2] Ya-juan LI, Xue-kang CHEN, Ji WANG. Research of ion-induced secondary electron emission from MgO film. Vacuum & Cryogenics, 19, 135-140(2013).
[4] J VANIER, C AUDOIN. The classical caesium beam frequency standard: fifty years later. Metrologia, 42, 31-42(2005).
[5] C THOMAS. Impact of new clock technologies on the stability and accuracy of the international atomic time TAI. Ferroelectrics & Frequency Control, 44, 693-700(1997).
[7] Yun-ting GU, Yan-jian LIN, Bao-jun YAN. Design of new electron gun capable of generating nniform electron-beam with large width. Chinese Journal of Vacuum Science and Technology, 39, 1109-1113(2019).
[8] Xiao-feng LI, Ting-tao LI, Jin-neng ZENG. Study on the improvement of input signal utilization of MCP. Acta Photonica Sinica, 49, 0325002(2020).
[10] P GYFTOPOULOSE. Thermionic energy conversion.volume I. processes and devices(1973).
[11] Wu-yue ZHONG, Zheng LU, Jian-ping ZHENG. Distribution of electron potential energy of ignited cesium thermionic energy converter. Atomic Energy Science and Technology, 53, 2223-2232.(2019).
[12] T KUBART, M CADA, D LUNDIN. Investigation of ionized metal flux fraction in HiPIMS discharges with Ti and Ni targets. Surface and Coatings Technology, 238, 152-157(2014).
[13] J BOHLMARK, J ALAMI, C CHRISTOU. Ionization of sputtered metals in high power pulsed magnetron sputtering. Films, 23, 18-19(2005).
[14] J T GUDMUNDSSON. The high power impulse magnetron sputtering discharge as an ionized physical vapor deposition tool. Vacuum, 84, 1360-1364(2010).
[15] Xiao-hu WANG, Zhen YANG, Lin-wen ZHANG. An ion beam profiler based on secondary electron emission. High Power Laser and Particle Beams, 25, 2121-2124(2013).