Dunwei LIAO, Yuejun ZHENG, Hao CUI, Tie CUN, Yunqi FU. Mechanism analysis and verification of double-layer micro-nano structure to enhance electromagnetic shielding[J]. Optics and Precision Engineering, 2022, 30(11): 1310

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- Optics and Precision Engineering
- Vol. 30, Issue 11, 1310 (2022)
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