Measurement of Refractive-index Profiles for Planar Waveguides

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Acta Photonica Sinica >Volume 34 >Issue 4 >Page 534 > Article

Acta Photonica Sinica
Vol. 34, Issue 4, 534 (2005)

Measurement of Refractive-index Profiles for Planar Waveguides

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]

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[in Chinese]

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DOI: Cite this Article

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement of Refractive-index Profiles for Planar Waveguides[J]. Acta Photonica Sinica, 2005, 34(4): 534 Copy Citation Text

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Abstract

Based on the principle of prism coupling and improved inverse WKB theory, the refractive-index profiles of planar waveguides were measured. The refractive-index curves of ion exchange glass waveguides were obtained by this way. The method has advantages on convenient operation and accurate results.

Keywords

Planar waveguide Refractive-index profile Prism coupling

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement of Refractive-index Profiles for Planar Waveguides[J]. Acta Photonica Sinica, 2005, 34(4): 534

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