Researching

Journals
  • Advanced Photonics
  • Photonics Insights
  • Advanced Photonics Nexus
  • Photonics Research
  • Advanced Imaging
  • View All Journals
  • Chinese Optics Letters
  • High Power Laser Science and Engineering
    • Articles
  • Optics
  • Physics
  • Geography
  • View All Subjects
    • Conferences
  • CIOP
  • HPLSE
  • AP
  • View All Events
    • News
    About CLP
    Search by keywords or author
    Journals >Chinese Journal of Lasers >Volume 45 >Issue 10 >Page 1003002 > Article
    • Chinese Journal of Lasers
    • Vol. 45, Issue 10, 1003002 (2018)
    Surface Modification and Optical Properties of ZnO Nanowires
    Hu Ying1, Li Haolin1, Wang Dengkui1, Jia Huimin1, Wei Zhipeng1, Wang Xiaohua1, Fang Xuan1, Fang Dan1, and Wang Xinwei2
    Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
    • show less
    DOI: 10.3788/cjl201845.1003002 Cite this Article Set citation alerts
    Hu Ying, Li Haolin, Wang Dengkui, Jia Huimin, Wei Zhipeng, Wang Xiaohua, Fang Xuan, Fang Dan, Wang Xinwei. Surface Modification and Optical Properties of ZnO Nanowires[J]. Chinese Journal of Lasers, 2018, 45(10): 1003002 Copy Citation Text show less
    Cited By
    Article index updated: Jun. 17, 2024
    The article is cited by 4 article(s) CLP online library. (Some content might be in Chinese.)
    Abstract
    Get PDF(in Chinese)
    Figures&Tables (5)
    Equations (0)
    References (23)
    Cited By (4)
    Get Citation
    Copy Citation Text
    Hu Ying, Li Haolin, Wang Dengkui, Jia Huimin, Wei Zhipeng, Wang Xiaohua, Fang Xuan, Fang Dan, Wang Xinwei. Surface Modification and Optical Properties of ZnO Nanowires[J]. Chinese Journal of Lasers, 2018, 45(10): 1003002
    Download Citation
    Set citation alerts for the article
    Tools
    Share
    Set citation alerts for the article
    Save the article for my favorites
    Paper Information
    Recommended Topics
    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology