[1] Ji Y., Ran F., Xu H. G., Huang S. P. and Shen W. X., Journal of Optoelectronics·Laser 23, 1717 (2012). (in Chinese)

[2] Hoffman R. L., Norris B. J. and Wager J. F., Appl. Phys. Lett. 82, 733 (2003).

[3] Wood R., Bruce I., Moon C. B., Kim W. Y. and Mascher P., Organic Electronics 13, 3254 (2012).

[4] Chan I., Moradi M., Sazonov A. and Nathan A., J. Disp. Technol. 7, 36 (2011).

[5] Tanabe A., Hanmura M., Katoh T., Oomori H., Honma A. and Suzuki T., IEICE Transactions on Electronics 95, 1737 (2012).

[6] Li W. Y., Jiang L. X., Yin G. L., Wang Y. Y., Yu Z. and He D. N., Rare Met. 32, 273 (2013).

[7] Chen L. Q., Yang S. Y., Yu Z. N., Xue W. and Zou B. S., Journal of Optoelectronics·Laser 24, 843 (2013). (in Chinese)

[8] Nomura K., Ohta H., Takagi A., Kamiya T., Hirano M. and Hosono H., Nature 432, 488 (2004).

[9] Yabuta H., Sano M., Abe K., Aiba T., Den T., Kumomi H., Nomura K., Kamiya T. and Hosono H., Appl. Phys. Lett. 89, 112 (2006).

[10] Ito M., Miyazaki C., Ishizaki M., Kon M., Ikeda N., Okubo T., Matsubara R., Hatta K., Ugajin Y. and Sekine N., Journal of Non-Crystalline Solids 354, 2777 (2008).

[11] Lee Y. S., Dai Z. M., Lin C. I. and Lin H. C., Ceram. Int. 38, S595 (2012).

[12] Zhao X. M., Experimental Design Method, Beijing: Science Press, 65 (2006). (in Chinese)

[13] Hosono H., Takagi A., Nomura K., Ohta H., Yanagi H., Kamiya T. and Hirano M., Thin Solid Films 486, 38 (2005).

[14] Chiang H. Q., McFarlane B. R., Hong D., Presley R. E. and Wager J. F., Journal of Non-Crystalline Solids 354, 2826 (2008).