Research on Minority Carrier Lifetime Measurements of HgCdTe Thin Film

Wei-lin SHE; Chen SHEN; Qian LI; Ming LIU; Da LI; Jing-xia SHI

doi:10.3969/j.issn.1672-8785.2021.06.001

Journals >INFRARED >Volume 42 >Issue 6 >Page 1 > Article

INFRARED
Vol. 42, Issue 6, 1 (2021)

Research on Minority Carrier Lifetime Measurements of HgCdTe Thin Film

Wei-lin SHE^*, Chen SHEN, Qian LI, Ming LIU, Da LI, and Jing-xia SHI

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[in Chinese]

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DOI: 10.3969/j.issn.1672-8785.2021.06.001 Cite this Article

SHE Wei-lin, SHEN Chen, LI Qian, LIU Ming, LI Da, SHI Jing-xia. Research on Minority Carrier Lifetime Measurements of HgCdTe Thin Film[J]. INFRARED, 2021, 42(6): 1 Copy Citation Text

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References

[2] Balcerak R, Brown L. Mercury Cadmium Telluride Material Requirement for Infrared System[J]. Journal of Vacuum Science & Technology B, 1992, 10(4): 1353-1358.

[3] Eikelboom J A, Leguijt C, Frumau C F A, et al. Microwave Detection of Minority Carriers in Solar Cell Silicon Wafers[J]. Solar Energy Material and Solar Cells, 1995, 36(2): 169-185.

[5] Dhar N K, Tidrow M Z. Large-Format IRFPA Development on Silicon[C]. SPIE, 2004, 5564: 34-43.

[6] Hahn T, Schmerler S, Hahn S, et al. Interpretation of Lifetime and Defect Spectroscopy Measurements by Generalized Rate Equations[J]. Journal of Materials Science: Materials in Electronics, 2008, 19(2): 79-82.

CLP Journals

[1] Linhua Gao, Yanxia Cui, Qiangbing Liang, Yanzhen Liu, Guohui Li, Mingming Fan, Yuying Hao. Research progress in metal-inorganic semiconductor-metal photodetectors[J]. Infrared and Laser Engineering, 2020, 49(8): 20201025

SHE Wei-lin, SHEN Chen, LI Qian, LIU Ming, LI Da, SHI Jing-xia. Research on Minority Carrier Lifetime Measurements of HgCdTe Thin Film[J]. INFRARED, 2021, 42(6): 1

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