The effective experiments for extracting global tilt information of an object with structural extension

[in Chinese]; [in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 31 >Issue 11 >Page 5 > Article

Opto-Electronic Engineering
Vol. 31, Issue 11, 5 (2004)

The effective experiments for extracting global tilt information of an object with structural extension

[in Chinese], [in Chinese], and [in Chinese]

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[in Chinese]

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[in Chinese], [in Chinese], [in Chinese]. The effective experiments for extracting global tilt information of an object with structural extension[J]. Opto-Electronic Engineering, 2004, 31(11): 5 Copy Citation Text

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Abstract

[in Chinese], [in Chinese], [in Chinese]. The effective experiments for extracting global tilt information of an object with structural extension[J]. Opto-Electronic Engineering, 2004, 31(11): 5

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