• Chinese Journal of Lasers
  • Vol. 37, Issue 3, 822 (2010)
Zhao Man*, Zhao Mei, Fan Xiuying, Zhou Maiyu, Gu Feng, Zhang Yong, and Bao Jinhe
Author Affiliations
  • [in Chinese]
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    DOI: 10.3788/CJL20103703.0822 Cite this Article Set citation alerts
    Zhao Man, Zhao Mei, Fan Xiuying, Zhou Maiyu, Gu Feng, Zhang Yong, Bao Jinhe. Effects of Thermal Annealing on the Properties of GaN Metal-Semiconductor-Metal UV Photodetectors[J]. Chinese Journal of Lasers, 2010, 37(3): 822 Copy Citation Text show less

    Abstract

    Metal-semiconductor-metal structured GaN ultraviolet photodetectors are fabricated on sapphire substrates by metalorganic chemical vapor deposition. The properties of GaN photodetectors are improved through thermal annealing. With a 3 V bias,the very low dark current is about 200 pA,the maximum responsivity of 0.19 A/W is achieved at 362 nm,and the corresponding detectivity is 1.2×1011cm·Hz1/2/W. The physical mechanism about the effects of thermal annealing is studied,which is attributed to the introducing Au by the thermal annealing.
    Zhao Man, Zhao Mei, Fan Xiuying, Zhou Maiyu, Gu Feng, Zhang Yong, Bao Jinhe. Effects of Thermal Annealing on the Properties of GaN Metal-Semiconductor-Metal UV Photodetectors[J]. Chinese Journal of Lasers, 2010, 37(3): 822
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