• Journal of Terahertz Science and Electronic Information Technology
  • Vol. 21, Issue 2, 176 (2023)
ZHOU Mengzhe and ZHOU Wei*
Author Affiliations
  • [in Chinese]
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    DOI: 10.11805/tkyda2020493 Cite this Article
    ZHOU Mengzhe, ZHOU Wei. Design of full electronic fuze tester based on dual core architecture[J]. Journal of Terahertz Science and Electronic Information Technology , 2023, 21(2): 176 Copy Citation Text show less

    Abstract

    The traditional passive-resistance test of all electronic fuze adopts external on resistance test equipment or general on resistance test circuit design, which has nothing to do with the electrical performance test of full electronic fuze, and can not avoid the risk of the failure product burning after power on. Therefore, a systematic design idea is proposed to diagnose the electrical performance of passive-resistance and full electronic fuze. This paper designs a full-automatic test control architecture based on ARM chip and FPGA dual core architecture and a 24 bit high-precision four-wire passive-resistance test circuit. The passive-resistance of the external interface part of the all electronic fuze and the working characteristics of the fuze are comprehensively tested. The test results show that the design can be utilized to test the passive-resistance with high precision(the measuremetn accuracy is ±0.1%) as well as the comprehensive working performance after power on.
    ZHOU Mengzhe, ZHOU Wei. Design of full electronic fuze tester based on dual core architecture[J]. Journal of Terahertz Science and Electronic Information Technology , 2023, 21(2): 176
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