Simulation analysis of cable harsh electromagnetic irradiation susceptibility about electronics

LIU Enbo; LI Zhishen; CHEN Qi; ZHANG Yu

doi:10.11805/tkyda201906.1045

Journals >Journal of Terahertz Science and Electronic Information Technology >Volume 17 >Issue 6 >Page 1045 > Article

Journal of Terahertz Science and Electronic Information Technology
Vol. 17, Issue 6, 1045 (2019)

Simulation analysis of cable harsh electromagnetic irradiation susceptibility about electronics

LIU Enbo^1、*, LI Zhishen², CHEN Qi¹, and ZHANG Yu¹

Author Affiliations

¹[in Chinese]

²[in Chinese]

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DOI: 10.11805/tkyda201906.1045 Cite this Article

LIU Enbo, LI Zhishen, CHEN Qi, ZHANG Yu. Simulation analysis of cable harsh electromagnetic irradiation susceptibility about electronics[J]. Journal of Terahertz Science and Electronic Information Technology , 2019, 17(6): 1045 Copy Citation Text

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References

[7] NIE Baolin,DU Ping'an,YU Yating,et al. Study of the shielding properties of enclosures with apertures at higher frequencies using the transmission-line modeling method[J]. IEEE Transactions on Electromagnetic Compatibility, 2011,53(1):73-81.

[8] LIU Enbo,DU Ping'an,NIE Baolin. An extended analytical formulation for fast prediction of shielding effectiveness of an enclosure at different observation points with an off-axis aperture[J]. IEEE Transactions on Electromagnetic Compatibility, 2014,56(3):589-598.

[13] HOEFER W J R. The transmission-line matrix method—theory and applications[J]. IEEE Transactions on Microwave Theory Technology, 1985,33(10):882-893.

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