• Acta Photonica Sinica
  • Vol. 34, Issue 9, 1359 (2005)
[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. A Model for 1/f Noise in Optoelectronic Coupled Devices[J]. Acta Photonica Sinica, 2005, 34(9): 1359 Copy Citation Text show less
    References

    [1] Dai Y S, Xu J Sh. The noise analysis and noise reliability indicators of optoelectronic coupled devices. Solid-State Electronics, 2000,44(5): 1495~1500

    [3] Harder C, Katz, Margalit S, et al. A noise equivalent circuit of a semiconductor laser diode. IEEE J Quant Rlectron, 1982,18(3): 333~341

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    [2] ZHANG Wen-wen, CHEN Qian. Noise Characteristics of Electron Multiplying Charge Coupled Devices[J]. Acta Photonica Sinica, 2009, 38(4): 756

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. A Model for 1/f Noise in Optoelectronic Coupled Devices[J]. Acta Photonica Sinica, 2005, 34(9): 1359
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