[1] M. J. Huang, Z.-N. He, and F.-Z. Lee, Measurement 36, 93 (2004).
[2] C. Quan, C. J. Tay, F. Yang, and X. He, Appl. Opt. 44, 4814 (2005).
[3] R. Ambu, F. Aymerich, F. Ginesu, and P. Priolo, Compos. Sci. Technol. 66, 199 (2006).
[4] N. A. Ochoa, F. M. Santoyo, A. J. Moore, and C. P. López, Appl. Opt. 36, 2783 (1997).
[5] K. H. Womack, Opt. Eng. 23, 391 (1984).
[6] P. Sun, L. Zhang, and C. Tao, Acta Photon. Sin. (in Chinese) 34, 1074 (2005).
[7] P. Perona and J. Malik, IEEE Trans. Pattern Analysis and Machine Intelligence 12, 629 (1990).
[8] F. Catté, P.-L. Lions, J.-M. Morel, and T. Coll, SIAM J. Numer. Anal. 29, 182 (1992).
[9] Y. Chen, C. A. Z. Barcelos, and B. A. Mair, Comput. Vis. Image Understand. 82, 85 (2001).
[10] W. Qian, R. Liu, W. Wang, S. Qi, W. Wang, and J. Cheng, Journal of Image and Graphics (in Chinese) 11, 818 (2006).
[11] C. Tang, F. Zhang, H. Yan, and Z. Chen, Opt. Commun. 260, 91 (2006).
[12] L. I. Rudin, S. Osher, and E. Fatemi, Phys. D 60, 259 (1992).
[13] S. L. Keeling, Appl. Math. Comput. 139, 101 (2003).
