• Optics and Precision Engineering
  • Vol. 20, Issue 4, 727 (2012)
LI Jie1,2,*, WU Fan1, WU Shi-bin1, KUANG Long1, and LIN Chang-qing1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/ope.20122004.0727 Cite this Article
    LI Jie, WU Fan, WU Shi-bin, KUANG Long, LIN Chang-qing. Determination of measurement point distribution for contact measurement of large aspheric mirror surface[J]. Optics and Precision Engineering, 2012, 20(4): 727 Copy Citation Text show less
    References

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    [2] TOM L Z, JAMES H B, WARREN B D, et al.. Measurements of large optical surfaces with a laser tracker [J]. SPIE, 2008,7018:70183U-1-70183U-12.

    [3] TANG J G, WU F, WU SH B. Research on testing techniques for larger aperture aspherical surface in the fine grinding stage [J]. Optical Technique, 2001,27(6):509-511. (in Chinese)

    [4] HE J, CHEN L. Measurement of aspheric surfaces by infrared interferometer[J]. Opt. Precision Eng., 2010,18(1):69-74 .(in Chinese)

    [5] WANG X K, WANG L H, DENG W J, et al.. Measurement of large aspheric mirrors by non-null testing[J]. Opt. Precision Eng., 2011,19(3):520-528.(in Chinese)

    [6] LI F ZH, LUO X, ZHAO J L, et al.. Test of off-axis aspheric surfaces with CGH[J]. Opt. Precision Eng., 2011,19(4):709-716 .(in Chinese)

    [7] HE X, MA J. Design of common path radial shearing interferometer[J]. Opt. Precision Eng., 2011,19(9):2029-2035.(in Chinese)

    [8] MARCIN S, WLADYSLAW J. Optimization of measuring strategies in coordinate measuring technique[J]. Measurement Science Review,2001,1(1):191-194.

    [9] VIRENDRA N M.Zernike polynomials and aberration balancing[J]. SPIE, 2003,5173:1-17.

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    CLP Journals

    [1] ZHU Yong-jian, NA Jing-xin, WANG Yu, ZHI Ya-nan, FAN Yu-feng. Radial shearing Jamin interferometer with variable carrier frequency[J]. Optics and Precision Engineering, 2014, 22(5): 1176

    LI Jie, WU Fan, WU Shi-bin, KUANG Long, LIN Chang-qing. Determination of measurement point distribution for contact measurement of large aspheric mirror surface[J]. Optics and Precision Engineering, 2012, 20(4): 727
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