[1] K. Leo, Science 310, 1762 (2005).
[2] Y. Sun, N. Giebink, H. Kanno, B. Wa, M. E. Thompson and S. R. Forrest, Nature 44, 908 (2006).
[3] S. H. Choi, T. I. Lee, H. K. Baik, H. H. Roh, O. Y. Kwon and D. H. Suh, Appl. Phys. Lett. 93, 183301(2008).
[4] J. W. Park and Y. Kawakami, IEEE J. Display Technol. 2, 333 (2006).
[5] M. W. Shin, H. C. Lee, K. S. Kim, S. H. Lee and J. C. Kim, Thin Solid Films 363, 244 (2000).
[6] L. Pohl, E. Kollár, Zs. Kohári and A. Poppe, Electro- thermal Investigation of OLEDs, Proceedings of the 14th International Workshop on the Thermal Inveatigation of ICs and Systems, 235 (2008).
[7] Jongwoon Park, Taehyun Ban and Daehyuk Choi, J. Lightwave Technol. 29, 2684 (2011).
[8] H .J. Kong, J. W. Park and Y. M. Kim, Semicond. Sci. Tech. 28, 015011 (2013).
[9] A. R. Robertson, J. Opt. Soc. Am. 58, 1528 (1968).
[10] Commission Internationale de l’ éclairage (CIE), Method of Specifying and Measuring Color Rendering Properties of Light Sources, Central Bureau CIE, Vienna, Austria, CIE Publ. 13.3, 1995.
[11] Z. Q. Guo, T. M. Shih, Y. J. Lu, Y. L. Gao, L. H. Zhu, G. L. Chen, J. H. Zhang, S. Q. Lin and Z. Chen, IEEE Photonics Journal 5, 8200409 (2013).
[12] Berman SM, J. Illumin. Eng. Soc. 21, 3 (1992).
[13] T. Erdem and H. V. Demir, Nanophotonics 2, 57 (2013).
