[1] C. J. Stolz, L. M. Sheehan, S. M. Maricle, S. Schwartz, and J. Hue, Proc. SPIE 3578, 144 (1999).

[2] M. R. Kozlowski, C. R. Wolfe, M. C. Staggs, and J. H. Campbell, Proc. SPIE 1438, 376 (1989).

[3] Y. Cui, Y. Zhao, Y. Jin, Z. Fan, and J. Shao, Acta Opt. Sin. (in Chinese) 27, 1129 (2007).

[4] J. Huang, H. Lu, L. Ye, S. Zhao, H. Wang, X. Jiang, X. Yuan, and W. Zheng, Chinese J. Lasers (in Chinese) 34, 723 (2007).

[5] D. Li, Y. Zhao, J. Shao, Z. Fan, and H. He, Chin. Opt. Lett. 6, 386 (2008).

[6] L. Sheehan, M. Kozlowski, F. Rainer, and M. Staggs, Proc. SPIE 2114, 559 (1994).

[7] H. Bercegol, Proc. SPIE 3578, 421 (1999).

[8] X. Liu, D. Li, X. Li, Y. Zhao, and J. Shao, Chinese J. Lasers (in Chinese) 36, 1545 (2009).

[9] ISO 11254-1, Lasers and laser-related equipment Determination of laser-induced damage threshold of optical surfaces——Part 1: 1-on-1 test (2002).

[10] L. G. Deshazer, B. E. Newnam, and K. M. Leung, Appl. Phys. Lett. 23, 607 (1973).

[11] J. Capoulade, L. Gallais, J.-Y. Natoli, and M. Commandre, Appl. Opt. 47, 5272 (2008).

[12] H. Krol, L. Gallais, C. Grezes-Besset, J.-Y. Natoli, and M. Commandre, J. Opt. Commun. 256, 184 (2005).