Testing of Failure Mechanism Consistency Based on Principle of Acceleration Factor Constancy

SUO Bin; TAN Qitao; HU Tiansong; TANG Jiayin

doi:10.3969/j.issn.1671-637x.2021.01.003

Journals >Electronics Optics & Control >Volume 28 >Issue 1 >Page 10 > Article

Electronics Optics & Control
Vol. 28, Issue 1, 10 (2021)

Testing of Failure Mechanism Consistency Based on Principle of Acceleration Factor Constancy

SUO Bin¹, TAN Qitao², HU Tiansong¹, and TANG Jiayin²

Author Affiliations

¹[in Chinese]

²[in Chinese]

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DOI: 10.3969/j.issn.1671-637x.2021.01.003 Cite this Article

SUO Bin, TAN Qitao, HU Tiansong, TANG Jiayin. Testing of Failure Mechanism Consistency Based on Principle of Acceleration Factor Constancy[J]. Electronics Optics & Control, 2021, 28(1): 10 Copy Citation Text

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References

[1] KIM S J, MUN B M, BAE S J.A cost-driven reliability demonstration plan based on accelerated degradation tests ［J］.Reliability Engineering and System Safety, 2018, 183:226-239.

[2] SUNG S.Optimal design of ramp-stress accelerated degradation tests based on the Wiener process ［J］.Microelectronics Reliability, 2019(113393):1-6.

[4] PIERUSCHKA E.Relation between lifetime distribution and the stress level causing failure, LMSD 800400［S］.Sunnyvale:Lockheed Missile and Space Division, 1961:1-30.

SUO Bin, TAN Qitao, HU Tiansong, TANG Jiayin. Testing of Failure Mechanism Consistency Based on Principle of Acceleration Factor Constancy[J]. Electronics Optics & Control, 2021, 28(1): 10

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