• Infrared Technology
  • Vol. 42, Issue 5, 473 (2020)
Qiang JIANG1、2、*, Yue YU3, Lingwei YE1、2, and Yuan HAO4
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • 4[in Chinese]
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    DOI: Cite this Article
    JIANG Qiang, YU Yue, YE Lingwei, HAO Yuan. Deconvolution Algorithm of THz-TDS Polyethylene Thickness Measurement Based on Modified Autocorrelation Algorithm[J]. Infrared Technology, 2020, 42(5): 473 Copy Citation Text show less
    References

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         Duvillaret L, Garet F, Coutaz J. Highly precise determination of optical constants and sample thickness in terahertz time-domain spectroscopy[J]. Appl. Opt., 1999, 38(2): 409-415.

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    [10] Zeiler M D, Taylor G W, Fergus R. Adaptive deconvolutional networks for mid and high level feature learning[C]//Computer Vision (ICCV), IEEE, 2011: 2018-2025.

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    [13] Tanaka Y, Hanawa K, Suzuki K, et al. Attenuation recovery technique for acoustic wave propagation in PEA method[C]//Electrical Insulating Materials, Proceedings of 2001 International Symposium on, 2001: 407-410.

         Tanaka Y, Hanawa K, Suzuki K, et al. Attenuation recovery technique for acoustic wave propagation in PEA method[C]//Electrical Insulating Materials, Proceedings of 2001 International Symposium on, 2001: 407-410.

    [16] Parruck B, Riad S M. An optimization criterion for iterative deconvolution[J]. IEEE Transactions on Instrumentation and Measurement, 1983, 32(1): 137-140.

         Parruck B, Riad S M. An optimization criterion for iterative deconvolution[J]. IEEE Transactions on Instrumentation and Measurement, 1983, 32(1): 137-140.

    JIANG Qiang, YU Yue, YE Lingwei, HAO Yuan. Deconvolution Algorithm of THz-TDS Polyethylene Thickness Measurement Based on Modified Autocorrelation Algorithm[J]. Infrared Technology, 2020, 42(5): 473
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