Researching

Journals
  • Advanced Photonics
  • Photonics Insights
  • Advanced Photonics Nexus
  • Photonics Research
  • Advanced Imaging
  • View All Journals
  • Chinese Optics Letters
  • High Power Laser Science and Engineering
    • Articles
  • Optics
  • Physics
  • Geography
  • View All Subjects
    • Conferences
  • CIOP
  • HPLSE
  • AP
  • View All Events
    • News
    About CLP
    Search by keywords or author
    Journals >Chinese Optics Letters >Volume 15 >Issue 10 >Page 102802 > Article
    • Chinese Optics Letters
    • Vol. 15, Issue 10, 102802 (2017)
    Coordinate difference homogenization matching method for motion correction in 3D range-intensity correlation laser imaging
    Liang Sun1、2, Xinwei Wang1、3、*, Pengdao Ren1, Pingshun Lei1, Songtao Fan1, Yan Zhou1、3, and Yuliang Liu1、4
    Author Affiliations
  • 1Optoelectronics System Laboratory, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
  • 3School of Electronic, Electrical and Communication Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
  • 4College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 100049, China
    • show less
    DOI: 10.3788/COL201715.102802 Cite this Article Set citation alerts
    Liang Sun, Xinwei Wang, Pengdao Ren, Pingshun Lei, Songtao Fan, Yan Zhou, Yuliang Liu. Coordinate difference homogenization matching method for motion correction in 3D range-intensity correlation laser imaging[J]. Chinese Optics Letters, 2017, 15(10): 102802 Copy Citation Text show less
    References

    [1] M. Laurenzis, F. Christnacher, D. Monnin. Opt. Lett., 32, 3146(2007).

    [2] X. Wang, Y. Li, Y. Zhou. Appl. Opt., 52, 7399(2013).

    [3] D. Lu, X. Wang, S. Fan, J. He, Y. Zhou, Y. Liu. Chin. Opt. Lett., 13, 081102(2015).

    [4] X. Liu, X. Wang, Y. Cao, S. Fan, Y. Zhou, Y. Liu. Chin. Opt. Lett., 13, 071102(2015).

    [5] X. Wang, Y. Zhou, Y. Liu. Chin. Opt. Lett., 10, 101101(2012).

    [6] M. Laurenzis, F. Christnacher, T. Scholz, N. Metzger, S. Schertzer, E. Bacher. Proc. SPIE, 9250, 925001(2014).

    [7] B. Goehler, P. Lutzmann. Proc. SPIE, 9649, 964902-1(2015).

    [8] M. Laurenzis, F. Christnacher. Adv. Opt. Technol., 2, 397(2013).

    [9] X. Wang, X. Liu, P. Ren, L. Sun, S. Fan, P. Lei, Y. Zhou. Proc. SPIE, 10020, 1002006(2016).

    [10] X. Wang, Y. Zhou, S. Fan, J. He, Y. Liu. Chin. Phys. Lett., 27, 094203(2010).

    [11] J. Busck, H. Heiselberg. Appl. Opt., 43, 4705(2004).

    [12] F. Christnacher, M. Laurenzis, D. Monnin, G. Schmitt, N. Metzger, S. Schertzer, T. Scholz. Proc. SPIE, 9250, 925001(2014).

    [13] H. Bay, T. Tuytelaars, L. Van Gool. ECCV, 3951, 404(2006).

    [14] D. Monnin, E. Bieber, G. Schmitt, A. Schneider. ACIVS, 6475, 203(2010).

    [15] L. Sun, X. Wang, X. Liu, P. Ren, P. Lei, J. He, S. Fan, Y. Zhou, Y. Liu. Appl. Opt., 55, 8284(2016).

    [16] M. Laurenzis, Y. Lutz, F. Chritnacher, A. Matwyschuk, J. M. Poyet. Opt. Eng., 51, 061302(2012).

    Data from CrossRef

    [1] C. DING, J. WEI. Label‐free superresolution effect of nonlinear reverse saturation absorption thin films through difference method. Journal of Microscopy, jmi.12838(2019).

    Full Text
    Get PDF
    Figures&Tables (6)
    Equations (2)
    References (16)
    Cited By (4)
    Get Citation
    Copy Citation Text
    Liang Sun, Xinwei Wang, Pengdao Ren, Pingshun Lei, Songtao Fan, Yan Zhou, Yuliang Liu. Coordinate difference homogenization matching method for motion correction in 3D range-intensity correlation laser imaging[J]. Chinese Optics Letters, 2017, 15(10): 102802
    Download Citation
    EndNote(RIS)
    BibTex
    Plain Text
    Set citation alerts for the article
    Tools
    Share
    Set citation alerts for the article
    Save the article for my favorites
    Paper Information
    Recommended Topics
    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology