• Journal of Infrared and Millimeter Waves
  • Vol. 20, Issue 6, 455 (2001)
[in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. AUTOMATIC MEASUREMENT SYSTEM OF SUBMILLIMETER WAVE LASER[J]. Journal of Infrared and Millimeter Waves, 2001, 20(6): 455 Copy Citation Text show less

    Abstract

    An automatic measurement system of submillimeter wave laser was introduced, in which a single chip machine played an important part. This system automatized measurement and used double path emendation to increase veracity and reliability of measurement. The system was used to measure the spectrum of miniature optically pumped NH 3 laser, demonstrating the high performance of the system.
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. AUTOMATIC MEASUREMENT SYSTEM OF SUBMILLIMETER WAVE LASER[J]. Journal of Infrared and Millimeter Waves, 2001, 20(6): 455
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