Feasibility analysis of junction temperature measurement for GaN-based high-power white LEDs by the peak-shift method

Jingjing Zhang; Tao Zhang; Shishen Liu; Shidong Yuan; Yafang Jin; Sheng Yang

doi:10.3788/col201311.091204

Journals >Chinese Optics Letters >Volume 11 >Issue 9 >Page 091204 > Article

Chinese Optics Letters
Vol. 11, Issue 9, 091204 (2013)

Feasibility analysis of junction temperature measurement for GaN-based high-power white LEDs by the peak-shift method

Jingjing Zhang, Tao Zhang, Shishen Liu, Shidong Yuan, Yafang Jin, and Sheng Yang

DOI: 10.3788/col201311.091204 Cite this Article Set citation alerts

Jingjing Zhang, Tao Zhang, Shishen Liu, Shidong Yuan, Yafang Jin, Sheng Yang. Feasibility analysis of junction temperature measurement for GaN-based high-power white LEDs by the peak-shift method[J]. Chinese Optics Letters, 2013, 11(9): 091204 Copy Citation Text

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