• Chinese Journal of Lasers
  • Vol. 46, Issue 2, 0211005 (2019)
Mei Gao1、*, Haolin Li1, Dengkui Wang1、*, Xinwei Wang2, Xuan Fang1, Dan Fang1, Jilong Tang1, Xiaohua Wang1, and Zhipeng Wei1
Author Affiliations
  • 1 State Key Laboratory of High Power Semiconductor Laser, Changchun University of Science and Technology, Changchun, Jilin 130022, China
  • 2 School of Materials Science and Engineering, Changchun University of Science and Technology, Changchun, Jilin 130022, China
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    DOI: 10.3788/CJL201946.0211005 Cite this Article Set citation alerts
    Mei Gao, Haolin Li, Dengkui Wang, Xinwei Wang, Xuan Fang, Dan Fang, Jilong Tang, Xiaohua Wang, Zhipeng Wei. Effects of Ar Plasma Treatment on Photoluminescence Properties of GaAs Nanowires[J]. Chinese Journal of Lasers, 2019, 46(2): 0211005 Copy Citation Text show less

    Abstract

    GaAs nanowires are treated with Ar plasma, and the effects of the bias power of plasma on the photoluminescence properties of the GaAs nanowires are studied by the photoluminescence test. The source and mechanism of each photoluminescence peak in photoluminescence spectra are studied at different temperatures and different excitation powers. The experimental results show that the free exciton emission of GaAs gradually disappears and the bound exciton emission decreases first and then increases with the increase of the power. When the power increases to 200 W, the donor-acceptor pair (DAP) emission appears. Comparing the photoluminescence spectra of different samples at 283 K, we obtain the structural changes of GaAs nanowires during plasma treatment. When the processing power is low, the Ar plasma eliminates the surface state and introduces a vacancy defect in GaAs; when the processing power is high, the crystal structure of GaAs is destroyed, and the DAP emission appears.
    Mei Gao, Haolin Li, Dengkui Wang, Xinwei Wang, Xuan Fang, Dan Fang, Jilong Tang, Xiaohua Wang, Zhipeng Wei. Effects of Ar Plasma Treatment on Photoluminescence Properties of GaAs Nanowires[J]. Chinese Journal of Lasers, 2019, 46(2): 0211005
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