• Acta Photonica Sinica
  • Vol. 34, Issue 8, 1179 (2005)
[in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Infrared Transmission Spectroscopy of B+ implanted HgCdTe Epilayers[J]. Acta Photonica Sinica, 2005, 34(8): 1179 Copy Citation Text show less
    References

    [1] Desterfanis G L. Electrical doping of HgCdTe by ion implantation and heat treatment.Journal of Crystal Growth,1988,86:700~722

    [2] Declemy A,Renault P O. Characterization by diffuse Xray scattering of damage in ion-implanted HgCdTe.Journal of Crystal Growth,1996,161:139~143

    [3] Margalit S,Nemirovsky Y, Rotstein I. Electrical properties of ion-implanted layers in HgCdTe.J Appl Phys,1979,50(10):6386~6389

    [4] Herber Engstrom. Infrared reflectivity and transmissivity of boron-implanted, laser-annealed silicon.J Appl Phys, 1980,51(10):5245~5249

    [7] Leveque P,Declemy A,Renault P O. Influence of extended structural defects on the effective carrier concentration of p-type Hg0.78Cd0.22Te implanted with aluminium ions.Nuclear Instruments and Methods in Physics Research B,2000,168:40~46

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Infrared Transmission Spectroscopy of B+ implanted HgCdTe Epilayers[J]. Acta Photonica Sinica, 2005, 34(8): 1179
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