• High Power Laser and Particle Beams
  • Vol. 36, Issue 4, 043015 (2024)
Gong Chen, Dong Jiang, Qifu Wang, Shichao Zeng, and Feng Wang
Author Affiliations
  • The 10th Research Institute of China Electronics Technology Group Corporation, Chengdu 610036, China
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    DOI: 10.11884/HPLPB202436.230384 Cite this Article
    Gong Chen, Dong Jiang, Qifu Wang, Shichao Zeng, Feng Wang. Analysis of standards and test methods for aircraft and subsystem lightning effects[J]. High Power Laser and Particle Beams, 2024, 36(4): 043015 Copy Citation Text show less
    testing itemsregionsnumbers of test set-upwaveform
    DO160G.23 (EUROCAE ED14G.23) 、HB6167.25SAE ARP 5416A、GJB3567ADO160G.23 (EUROCAE ED14G.23) 、HB6167.25SAE ARP 5416A、GJB3567ADO160G.23 (EUROCAE ED14G.23) 、HB6167.25SAE ARP 5416A、GJB3567A
    initial leader attachment test1A、1B1A、1B13DA、D
    swept channel attachment test1C、2A、2B、3N1C、2A、2B22AA
    high voltage strike attachment test on models///2/C、D
    Table 1. High voltage testing items and requirements
    testing itemsregionsnumbers of test set-upwaveform
    DO160G.23 (EUROCAE ED14G.23)、HB6167.25SAE ARP 5416A、GJB3567ADO160G.23 (EUROCAE ED14G.23)、HB6167.25SAE ARP 5416A、GJB3567ADO160G.23 (EUROCAE ED14G.23)、HB6167.25SAE ARP 5416A、GJB3567A
    arc entry test1A、1B、1C、2A、2B、3N1A、1B、1C、2A、2B11component A、Ah、A/5、B、C、C*、Dcomponent A、Ah、B、C、C*、D
    non-conductive surfaces test/1A、1C、2A/1/component A、Ah or D
    conducted current test/3/1/component A、B、C、Ah or D
    induced transients in external mounted hardware1A、1B、1C、2A、2B、3N1A、1B、1C、2A、2B11refer to arc entry test and conducted current testrefer to arc entry test and conducted current test
    fuel system testrefer to arc entry test and conducted current testrefer to arc entry test and conducted current test21refer to arc entry test and conducted current testrefer to arc entry test and conducted current test
    Table 2. High current testing items and requirements
    testing itemstest levelnumber of test set-upswaveform
    DO160G.22 (EUROCAE ED14G.22)、HB6167.24SAE ARP 5416A、GJB3567ADO160G.22 (EUROCAE ED14G.22)、HB6167.24SAE ARP 5416A、GJB3567ADO160G.22 (EUROCAE ED14G.22)、HB6167.24SAE ARP 5416A、GJB3567A
    pulse current aircraft test/1/1/component A、Ah
    pin injection test55233、4、5A3、4、5A
    wire bundle test55221~61~6
    Table 3. Indirect effects testing items and requirements
    Gong Chen, Dong Jiang, Qifu Wang, Shichao Zeng, Feng Wang. Analysis of standards and test methods for aircraft and subsystem lightning effects[J]. High Power Laser and Particle Beams, 2024, 36(4): 043015
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