A NEW TYPE OF ATOMIC FORCE MICROSCOPE AND ITS APPLICATIONS

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Acta Photonica Sinica >Volume 31 >Issue 1 >Page 50 > Article

Acta Photonica Sinica
Vol. 31, Issue 1, 50 (2002)

A NEW TYPE OF ATOMIC FORCE MICROSCOPE AND ITS APPLICATIONS

[in Chinese], [in Chinese], [in Chinese], and [in Chinese]

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[in Chinese]

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DOI: Cite this Article

[in Chinese], [in Chinese], [in Chinese], [in Chinese]. A NEW TYPE OF ATOMIC FORCE MICROSCOPE AND ITS APPLICATIONS[J]. Acta Photonica Sinica, 2002, 31(1): 50 Copy Citation Text

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References

[1] Binnig G,Rohrer H.Scanning tunneling microscope.Helev Phys Acta,1982,55(4):726～729

[2] Binnig G,Quate C F.Atomic force microscope.Phys Rev Lett,1986,56(5):930～935

[5] Zhang H J,Higuchi T,Nishioki N.Dual tunneling unit STM for length measurement based on crystalline lattice.J Vac Sci Technol(B),1997,15(1):174～179

[6] Zhang H J,Huang F,Higuchi T.Dual unit STM-AFM for length measurement based on reference scales.J Vac Sci Technol(B),1997,15(4):780～784

[in Chinese], [in Chinese], [in Chinese], [in Chinese]. A NEW TYPE OF ATOMIC FORCE MICROSCOPE AND ITS APPLICATIONS[J]. Acta Photonica Sinica, 2002, 31(1): 50

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