• Journal of Terahertz Science and Electronic Information Technology
  • Vol. 21, Issue 12, 1499 (2023)
DONG Yayun1, CUI Zhitong1, DU Chuanbao1, CHENG Yinhui1, NIE Xin1, WANG Wenzhuo2, and ZHENG Shengquan2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.11805/tkyda2021300 Cite this Article
    DONG Yayun, CUI Zhitong, DU Chuanbao, CHENG Yinhui, NIE Xin, WANG Wenzhuo, ZHENG Shengquan. Research on differential chip sensitivity test based on pulsed current injection[J]. Journal of Terahertz Science and Electronic Information Technology , 2023, 21(12): 1499 Copy Citation Text show less

    Abstract

    The sensitivity threshold of differential signal receiving chip(DS26C32ATM) is studied by Pulse Current Injection(PCI) technology. The experimental results show that the injection current on transmission line increases with the increase of pulsed voltage, and the interface circuit of differential signal receiving chip is damaged by electromagnetic pulse interference. The failure mechanism of the damaged chip is analyzed and the fault position is located. Based on the analysis results of failure mechanism, the protection of differential signal receiving chip is studied. The experimental results provide a reliable basis for the experiment of anti-electromagnetic pulse interference.
    DONG Yayun, CUI Zhitong, DU Chuanbao, CHENG Yinhui, NIE Xin, WANG Wenzhuo, ZHENG Shengquan. Research on differential chip sensitivity test based on pulsed current injection[J]. Journal of Terahertz Science and Electronic Information Technology , 2023, 21(12): 1499
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