• Journal of Applied Optics
  • Vol. 40, Issue 2, 284 (2019)
XI Yingxue*, LIU Weiguo, MA Zhanpeng, ZHANG Jin, and ZHOU Shun
Author Affiliations
  • [in Chinese]
  • show less
    DOI: 10.5768/jao201940.0203002 Cite this Article
    XI Yingxue, LIU Weiguo, MA Zhanpeng, ZHANG Jin, ZHOU Shun. Research on high deterministic removal characteristics of fused quartz using RF focused ion beam source[J]. Journal of Applied Optics, 2019, 40(2): 284 Copy Citation Text show less
    References

    [1] ARNOLD T, BHM G, FECHNER R, et al. Ultra-precision surface finishing by ion beam and plasma jet techniques: status and outlook[J]. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2010, 616(2/3): 147-156.

    [2] ALLEN L N. Progress in ion figuring large optics[J]. SPIE, 1994, 2428: 237-247.

    [3] LI Shengyi, DAI Yifan, XIE Xuhui, et al. New technology for manufacturing and measurement of large and middle-scale aspheric surfaces[M]. Beijing: National Defense Industry Press, 2011.

    [4] FAWCETT S C. Ion beam figuring of small optical components[J]. Optical Engineering, 1995, 34(12): 3565.

    [5] ALLEN L N, HANNON J H , WAMBACH R W. Final surface error correction of an off-axis aspheric petal by ionFiguring[J]. SPIE, 1991,1543: 190-200.

    [6] DAI Yifan, ZHOU Lin, XIE Xuhui, et al. Ion beam figuring technology[J]. Journal of Applied Optics, 2011, 32(4): 753-760.

    [7] WANG Dongfang. Research on atmospheric pressure plasma processing technology of fused silicon[J]. Journal of Shaanxi University of Technology: Natural Science Edition, 2013, 29(2): 1-5.

    [8] PHILIP S H.Optica needs for futrue space telescopes[J]. SPIE, 2003,5180: 1-5.

    [9] ALLEN D M, SHORE P, EVANS R W, et al. Ion beam, focused ion beam, and plasma discharge machining[J]. CIRP Annals, 2009, 58(2): 647-662.

    [10] CHEN Guiyang, XIE Xuhui, ZHOU Lin, et al. Removal function and stability study of RF ion source for optics figuring[J]. Aviation Precision Manufacturing Technology, 2016, 52(5): 19-22,40.

    [11] LIU Jinsheng.Ion beam technology and application[M]. Beijing: National Defense Industry Press,1995.

    [12] ZHANG Zhenpeng, XIE Xuhui, ZHOU Lin, et al. Structure design and performance research of RF neutralizer for optics figuring[J]. Aviation Precision Manufacturing Technology, 2017, 53(3): 8-11,15.

    [13] TANG Wa, DENG Weijie, ZHENG Ligong, et al. Calculation of removal function of ion beam Figuring and polishing experiment[J]. Optics and Precision Engineering, 2015, 23(1): 31-39.

    [14] ALLEN L N, KEIM R E. An ion figuring system for large optic fabrication[J]. SPIE, 1989,1168: 33-50.

    [15] KONG Bing, WANG Zhao, TAN Yushan. Gaussian fitting technique of laser spot[J]. Laser Technology, 2002, 26(4): 277-278.

    [16] DUAN Guping.Study of removal characteristics of ion beam polishing[D].Chengdu: Graduate School of Chinese Academy Sciences(Institute of Optics and electronics),2013.

    [17] KATARDJIEV I V. A kinematic model of surface evolution during growth and erosion: numerical analysis[J]. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 1989, 7(6): 3222-3232.

    [18] STEINBR CHEL C. Universal energy dependence of physical and ion-enhanced chemical etch yields at low ion energy[J]. Applied Physics Letters, 1989, 55(19): 1960-1962.

    [19] SIGMUND P. Sputtering by particle bombardment I[M]. Berlin: Springer-Verag, 1981.

    [20] LIAO Wenlin, DAI Yifan, ZHOU Lin, et al. Optical surface roughness in ion beam process[J]. Journal of Applied Optics, 2010, 31(6): 1041-1045.

    XI Yingxue, LIU Weiguo, MA Zhanpeng, ZHANG Jin, ZHOU Shun. Research on high deterministic removal characteristics of fused quartz using RF focused ion beam source[J]. Journal of Applied Optics, 2019, 40(2): 284
    Download Citation