[1] WU K H,YAN K.Research on the method of measuring defects of wheel set tread using optoelectronic technique[J].Optical Technique,2005,31(3):465-467.(in Chinese)

[2] WU J G,BIN H Z.Dimensional inspecting system of thin sheet parts based on machine vision [J].Opt.Precision Eng.,2007,15(1):124-130 .(in Chinese)

[3] ZHANG X J,ZUO CH C,WEN W,et al..Measurement of sparse scatter particulates based on computer vision[J].Opt.Precision Eng.,2007,15(4):612-614.(in Chinese)

[4] ZHOU X,LIU Y L.X-ray automatic inspection techniques for carbon product defects [J].Opt.Precision Eng.,2006,14(3):503-508.(in Chinese)

[5] DONG CH H,GAO ZH,YU X H.Matlab Wavelet Analysis Toolbox Principles and Applications [M].Beijing: National Defense Industry Press,2004.(in Chinese)

[6] YANG F SH.Project Analysis and Application of Wavelet[M].Beijing: Science Press,1999.(in Chinese)

[7] WANG Y,LU Y P,ZHANG Z H,et al..A reptile method with memory and alterable window for image boundary tracing[J].Chinese Journal of Scientific Instrument,2004,25(4):483-491.(in Chinese)