• Optoelectronic Technology
  • Vol. 41, Issue 4, 324 (2021)
Tian QIU1, Xiaoyan LIN1, Xin ZHANG1, Chuanbo QIN1, Chen Jung TSAI2, Lin LUO3, and Honglong NING4、*
Author Affiliations
  • 1Wuyi University⁃Institute of Semiconductors, CAS Joint Lab of Digital Optical Chip, Wuyi University , Jiangmen Guangdong, 529020,CHN
  • 2Astri , Hong Kong, 999077,CHN
  • 3Engineering College, Peking University, Beijing, 100871,CHN
  • 4Institute of Polymer Optoelectronic Materials and Devices, State Key Laboratory of Luminescent Materials and Devices, South China University of Technology, Guangzhou 51060,CHN
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    DOI: 10.19453/j.cnki.1005-488x.2021.04.014 Cite this Article
    Tian QIU, Xiaoyan LIN, Xin ZHANG, Chuanbo QIN, Chen Jung TSAI, Lin LUO, Honglong NING. Study on the Current Situation and Trends of OLED Defect Inspection for CELL Phase[J]. Optoelectronic Technology, 2021, 41(4): 324 Copy Citation Text show less

    Abstract

    The opportunities and challenges of developing OLED defect inspection technology and equipment for CELL segment were analyzed, and the OLED detection technologies, testing equipment and the popular equipment manufacturers for CELL segment were listed. Core products and technologies were classified and introduced. From the research point of view, the research contents of CELL segment were also classified and summarized, such as bright spot inspection, dark spot inspection and MURA detection, and the advantages and disadvantages of different methods were analyzed. Finally, the possible trends of CELL segment OLED inspection technology and equipment in the next few years were presented and discussed.
    Tian QIU, Xiaoyan LIN, Xin ZHANG, Chuanbo QIN, Chen Jung TSAI, Lin LUO, Honglong NING. Study on the Current Situation and Trends of OLED Defect Inspection for CELL Phase[J]. Optoelectronic Technology, 2021, 41(4): 324
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