• Electro-Optic Technology Application
  • Vol. 27, Issue 3, 69 (2012)
CAI Yun-xiang, TIAN Zhen-xi, and BI Dao-kun
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  • [in Chinese]
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    DOI: Cite this Article
    CAI Yun-xiang, TIAN Zhen-xi, BI Dao-kun. Character of Representative Spots from Background by Using Cluster Analysis[J]. Electro-Optic Technology Application, 2012, 27(3): 69 Copy Citation Text show less
    References

    [7] WISHART D. K-means clustering with outlier detection: the 25th Annual Conference of the German Classification Society[C]//Munich:University of Munich,2001:14-16.

    CAI Yun-xiang, TIAN Zhen-xi, BI Dao-kun. Character of Representative Spots from Background by Using Cluster Analysis[J]. Electro-Optic Technology Application, 2012, 27(3): 69
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